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Feature Parameter Design Using Cross-sectional SEM for Machine Learning-based Optimization in Plasma Etching
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 1162-1163
- Print publication:
- August 2020
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20-kV Diffractive Imaging of Graphene by using an SEM-based Dedicated Microscope
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 35-36
- Print publication:
- August 2015
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Diffraction Microscopy using 20-kV Electron Beam for Multi-Wall Carbon Nanotubes
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1026 / 2007
- Published online by Cambridge University Press:
- 01 February 2011, 1026-C07-06
- Print publication:
- 2007
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